High-Resolution Analysis Using Bent Perfect Crystal in Powder Diffraction: Part I-Reference-Cited by-同舟云学术

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High-Resolution Analysis Using Bent Perfect Crystal in Powder Diffraction: Part I

Published:2020-10 Issue:S1 Volume:14 Page:S146-S150
ISSN:1027-4510
Container-title:Journal of Surface Investigation: X-ray, Synchrotron and Neutron Techniques
language:en
Short-container-title:J. Synch. Investig.

Author:

Mikula P.,Šaroun J.,Stammers J.,Em V.

Publisher

Pleiades Publishing Ltd

Subject

Surfaces, Coatings and Films

Link

https://link.springer.com/content/pdf/10.1134/S1027451020070320.pdf

Reference16 articles.

1. J. Kulda, P. Mikula, P. Lukáš, and M. Kocsis, Phys. B (Amsterdam, Neth.), 180–181, 1041 (1992).

2. M. Vrána, P. Lukáš, P. Mikula, and J. Kulda, Nucl. Instrum. Methods Phys. Res., Sect. A 338, 125 (1994).

3. P. Lukáš, M. Vrána, P. Mikula, and J. Kulda, Proc. SPIE. 1738, 438 (1992).

4. P. Klimanek, T. Kschidock, P. Lukáš, P. Mikula, A. Mucklich, and M. Vrána, J. Phys., Colloq. 3, 2143 (1993).

5. M. Vrána, P. Mikula, P. Lukáš, J. Šaroun, and P. Strunz, Acta Phys. Hung. 75, 321 (1994).

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1. High-Resolution Analysis Using Bent Perfect Crystal in Powder Diffraction: Part II;Journal of Surface Investigation: X-ray, Synchrotron and Neutron Techniques;2020-10

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