High-depth-resolution Rutherford backscattering data and error analysis of SiGe systems using the simulated annealing and Markov chain Monte Carlo algorithms-Reference-Cited by-同舟云学术

High-depth-resolution Rutherford backscattering data and error analysis of SiGe systems using the simulated annealing and Markov chain Monte Carlo algorithms

Published:1999-02-15 Issue:7 Volume:59 Page:5097-5105
ISSN:0163-1829
Container-title:Physical Review B
language:en
Short-container-title:Phys. Rev. B

Author:

Barradas N. P.,Knights A. P.,Jeynes C.,Mironov O. A.,Grasby T. J.,Parker E. H. C.

Publisher

American Physical Society (APS)

Link

http://harvest.aps.org/v2/journals/articles/10.1103/PhysRevB.59.5097/fulltext

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