Tetrahedron-model analysis of silicon nitride thin films and the effect of hydrogen and temperature on their optical properties
Author:
Publisher
American Physical Society (APS)
Link
http://harvest.aps.org/v2/journals/articles/10.1103/PhysRevB.50.11801/fulltext
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1. Field effect in dc-sputtered a-Si:H in structure using SiNx prepared in situ
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