Raman analysis of phonon lifetimes in AlN and GaN of wurtzite structure-Reference-Cited by-同舟云学术

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Raman analysis of phonon lifetimes in AlN and GaN of wurtzite structure

Published:1999-05-15 Issue:20 Volume:59 Page:12977-12982
ISSN:0163-1829
Container-title:Physical Review B
language:en
Short-container-title:Phys. Rev. B

Author:

Bergman Leah,Alexson Dimitri,Murphy Patrick L.,Nemanich Robert J.,Dutta Mitra,Stroscio Michael A.,Balkas Cengiz,Shin Hyumin,Davis Robert F.

Publisher

American Physical Society (APS)

Link

http://harvest.aps.org/v2/journals/articles/10.1103/PhysRevB.59.12977/fulltext

Reference34 articles.

1. Raman scattering from LO phonon‐plasmon coupled modes in gallium nitride

2. Raman Spectroscopy for Characterization of Hard, Wide-Bandgap Semiconductors: Diamond, GaN, GaAlN, AlN, BN

3. First-Order Raman Effect in Wurtzite-Type Crystals

4. Raman analysis of the configurational disorder in AlxGa1−xN films

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