Residual stress estimation in ferroelectricPbTiO3thin films by Raman spectroscopy-Reference-Cited by-同舟云学术

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Residual stress estimation in ferroelectricPbTiO3thin films by Raman spectroscopy

Published:2009-03-05 Issue:10 Volume:79 Page:
ISSN:1098-0121
Container-title:Physical Review B
language:en
Short-container-title:Phys. Rev. B

Author:

Bartasyte A.,Margueron S.,Kreisel J.,Bourson P.,Chaix-Pluchery O.,Rapenne-Homand L.,Santiso J.,Jimenez C.,Abrutis A.,Weiss F.,Fontana M. D.

Publisher

American Physical Society (APS)

Subject

Condensed Matter Physics,Electronic, Optical and Magnetic Materials

Link

http://harvest.aps.org/v2/journals/articles/10.1103/PhysRevB.79.104104/fulltext

Reference50 articles.

1. Applications of Modern Ferroelectrics

2. Enhancement of Ferroelectricity in Strained BaTiO 3 Thin Films

3. Room-temperature ferroelectricity in strained SrTiO3

4. Structural phase transition in epitaxial perovskite films

5. Lattice strain in epitaxial BaTiO3 thin films

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