Bond lengths inGe1−xSixcrystalline alloys grown by the Czochralski method
Author:
Publisher
American Physical Society (APS)
Link
http://harvest.aps.org/v2/journals/articles/10.1103/PhysRevB.64.113206/fulltext
Reference22 articles.
1. Lattice parameters and local atomic structure of silicon-rich Si-Ge/Si (100) films
2. Bond-length relaxation in crystallineSi1−xGexalloys: An extended x-ray-absorption fine-structure study
3. Bond-length relaxation inSi1−xGexalloys
4. High-pressure low-temperature phase transition in a dopedpara-terphenyl crystal: A spectral-hole-burning study
5. First-shell bond lengths inSixGe1−xcrystalline alloys
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