Facile dual-shot measurement of Schmidt number in type-0 and type-2 downconversion

Abstract

High-dimensional entangled states have now been identified as excellent candidates towards the enhancement of the bandwidth of quantum systems. A variety of methods exist that aim to certify and set the bounds to entanglement. However, rapid and accurate approaches for precise quantification of the dimensions remain a challenge. Here, we report a facile, rapid and robust approach that quantifies a wide range of the spatial dimensions of high-dimensional entangled states using an interferometric technique using only two images. Our process works for a class of pure two-photon states, regardless of its separability and provides a fast and easy way to accurately measure the spatial Schmidt number which is a quantitative measure of dimensionality of entanglement. We apply our method to two-photon states generated by spontaneous parametric down-conversion (SPDC) and show that our results are in excellent agreement with numerical estimates. Since such estimates only exist for collinear phase matching in SPDC crystals, we also derive a noncollinear phase-matching condition applicable for type-2 crystals. In these nonlinear crystals, the commonly applied assumption of degenerate daughter photons no longer holds, leading to deviations from earlier theoretical predictions. Our interferometric technique provides excellent results for both type-0 and type-2 collinear phase-matching conditions, endorsing its wide applicability in quantum photonics. Published by the American Physical Society 2024