Magnetoelectric domain engineering from micrometer to Ångstrøm scales

Author:

Giraldo Marcela1ORCID,Simonov Arkadiy1ORCID,Sim Hasung2,Lotfy Ahmed Samir3ORCID,Lilienblum Martin1ORCID,Forster Lea1ORCID,Gradauskaite Elzbieta45ORCID,Trassin Morgan1ORCID,Park Je-Geun2,Lottermoser Thomas1ORCID,Fiebig Manfred1ORCID

Affiliation:

1. ETH Zurich

2. Seoul National University

3. KU Leuven

4. Laboratoire Albert Fert

5. Université Paris-Saclay

Abstract

The functionality of magnetoelectric multiferroics depends on the formation, size, and coupling of their magnetic and electric domains. Knowing the parameters guiding these criteria is a key effort in the emerging field of magnetoelectric domain engineering. Here we show, using a combination of piezoresponse-force microscopy, nonlinear optics, and x-ray scattering, that the correlation length setting the size of the ferroelectric domains in the multiferroic hexagonal manganites can be engineered from the micron range down to a few unit cells under the substitution of Mn3+ ions with Al3+ ions. The magnetoelectric coupling mechanism between the antiferromagnetic Mn3+ order and the distortive-ferroelectric order remains intact even at substantial replacement of Mn3+ by Al3+. Hence, chemical substitution proves to be an effective tool for domain-size engineering in one of the most studied classes of multiferroics. Published by the American Physical Society 2024

Funder

Schweizerischer Nationalfonds zur Förderung der Wissenschaftlichen Forschung

H2020 European Research Council

National Research Foundation of Korea

Publisher

American Physical Society (APS)

Cited by 1 articles. 订阅此论文施引文献 订阅此论文施引文献,注册后可以免费订阅5篇论文的施引文献,订阅后可以查看论文全部施引文献

同舟云学术

1.学者识别学者识别

2.学术分析学术分析

3.人才评估人才评估

"同舟云学术"是以全球学者为主线,采集、加工和组织学术论文而形成的新型学术文献查询和分析系统,可以对全球学者进行文献检索和人才价值评估。用户可以通过关注某些学科领域的顶尖人物而持续追踪该领域的学科进展和研究前沿。经过近期的数据扩容,当前同舟云学术共收录了国内外主流学术期刊6万余种,收集的期刊论文及会议论文总量共计约1.5亿篇,并以每天添加12000余篇中外论文的速度递增。我们也可以为用户提供个性化、定制化的学者数据。欢迎来电咨询!咨询电话:010-8811{复制后删除}0370

www.globalauthorid.com

TOP

Copyright © 2019-2024 北京同舟云网络信息技术有限公司
京公网安备11010802033243号  京ICP备18003416号-3