Minigap-induced negative differential resistance in multilayer MoS2 -based tunnel junctions

Author:

Kawasaki Seiya1,Kinoshita Kei1ORCID,Moriya Rai1ORCID,Onodera Momoko1ORCID,Zhang Yijin1ORCID,Watanabe Kenji2ORCID,Taniguchi Takashi2ORCID,Sasagawa Takao3ORCID,Machida Tomoki1ORCID

Affiliation:

1. University of Tokyo

2. National Institute for Materials Science

3. Tokyo Institute of Technology

Abstract

Despite extensive research, the high-energy band properties of transition metal dichalcogenides remain unexplored. Here, we reveal that a multilayer MoS2-based tunnel junction exhibits substantial negative differential resistance (NDR) owing to the presence of a minigap, which is the energy gap between the upper and lower bands of the valence band at the Γ point. We fabricated a highly p-doped multilayer p+MoS2/h-BN/p+MoS2 tunnel junction. When a bias is applied across the junction, holes at the Fermi level at the Γ point in the valence band of the source-side p+MoS2 resonantly tunnel to the drain-side p+MoS2 with momentum conservation. When the energy of the injected hole coincides with the minigap of the drain-side p+MoS2, the tunneling conductance is suppressed; thus, NDR is observed in the current-voltage characteristics. We identified minigap-induced NDR over a broad range of MoS2 thicknesses, including the bulk, that was observable even at room temperature. Published by the American Physical Society 2024

Funder

Japan Science and Technology Corporation

Japan Society for the Promotion of Science

Inoue Foundation for Science

Tokuyama Science Foundation

Support Center for Advanced Telecommunications Technology Research Foundation

Publisher

American Physical Society (APS)

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