Metrology in the presence of thermodynamically consistent measurements-Reference-Cited by-同舟云学术

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Metrology in the presence of thermodynamically consistent measurements

Published:2024-05-06 Issue:5 Volume:109 Page:
ISSN:2469-9926
Container-title:Physical Review A
language:en
Short-container-title:Phys. Rev. A

Author:

Vetrivelan Muthumanimaran¹,Panda Abhisek¹,Vinjanampathy Sai¹²³^ORCID

Affiliation:

1. Department of Physics, Indian Institute of Technology-Bombay, Powai, Mumbai 400076, India

2. Centre of Excellence in Quantum Information, Computation, Science and Technology, Indian Institute of Technology Bombay, Powai, Mumbai 400076, India

3. Centre for Quantum Technologies, National University of Singapore, 3 Science Drive 2, Singapore 117543

Funder

Department of Science and Technology, Ministry of Science and Technology, India

Publisher

American Physical Society (APS)

Link

http://harvest.aps.org/v2/journals/articles/10.1103/PhysRevA.109.052610/fulltext

Reference41 articles.

1. Advances in quantum metrology

2. Deterministic Quantum Phase Estimation beyond N00N States

3. Breaking the weak Heisenberg limit

4. Entanglement as a resource for local state discrimination in multipartite systems

5. Discriminating States: The Quantum Chernoff Bound

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