Identification of point defects using high-resolution electron energy loss spectroscopy
Author:
Funder
National Science Foundation
U.S. Department of Energy
Publisher
American Physical Society (APS)
Link
http://harvest.aps.org/v2/journals/articles/10.1103/PhysRevB.99.115312/fulltext
Reference48 articles.
1. Atom-by-atom structural and chemical analysis by annular dark-field electron microscopy
2. Three-dimensional imaging of individual hafnium atoms inside a semiconductor device
3. Optical gap and optically active intragap defects in cubic BN
4. High-resolution transmission electron microscopy of 60[ddot] dislocations in si-GaAs
5. Atomic core structure of Lomer dislocation at GaAs/(001)Si interface
Cited by 8 articles. 订阅此论文施引文献 订阅此论文施引文献,注册后可以免费订阅5篇论文的施引文献,订阅后可以查看论文全部施引文献
1. Probing Correlation of Optical Emission and Defect Sites in Hexagonal Boron Nitride by High-Resolution STEM-EELS;Nano Letters;2024-06-18
2. Local defect and mid-gap state analysis of GaN using monochromated EELS combined with nanodiffraction and atomic-resolution imaging;APL Materials;2024-03-01
3. Nanoscale observation of subgap excitations in β-Si3N4 with a high refractive index using low-voltage monochromated STEM: a new approach to analyze the physical properties of defects in dielectric materials;Applied Physics Express;2022-06-09
4. Analytical transmission electron microscopy for emerging advanced materials;Matter;2021-07
5. Bandgap engineering in III-nitrides with boron and group V elements: Toward applications in ultraviolet emitters;Applied Physics Reviews;2020-12
1.学者识别学者识别
2.学术分析学术分析
3.人才评估人才评估
"同舟云学术"是以全球学者为主线,采集、加工和组织学术论文而形成的新型学术文献查询和分析系统,可以对全球学者进行文献检索和人才价值评估。用户可以通过关注某些学科领域的顶尖人物而持续追踪该领域的学科进展和研究前沿。经过近期的数据扩容,当前同舟云学术共收录了国内外主流学术期刊6万余种,收集的期刊论文及会议论文总量共计约1.5亿篇,并以每天添加12000余篇中外论文的速度递增。我们也可以为用户提供个性化、定制化的学者数据。欢迎来电咨询!咨询电话:010-8811{复制后删除}0370
www.globalauthorid.com
TOP
Copyright © 2019-2024 北京同舟云网络信息技术有限公司 京公网安备11010802033243号 京ICP备18003416号-3