Optical-luminescence yield spectra produced by x-ray excitation-Reference-Cited by-同舟云学术

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Optical-luminescence yield spectra produced by x-ray excitation

Published:1993-03-15 Issue:12 Volume:47 Page:6918-6930
ISSN:0163-1829
Container-title:Physical Review B
language:en
Short-container-title:Phys. Rev. B

Author:

Emura Shuichi,Moriga Toshihiro,Takizawa Jun,Nomura Masaharu,Bauchspiess Karl Rudolf,Murata Takatoshi,Harada Katsuyuki,Maeda Hironobu

Publisher

American Physical Society (APS)

Link

http://harvest.aps.org/v2/journals/articles/10.1103/PhysRevB.47.6918/fulltext

Reference40 articles.

1. Intrinsic luminescence excitation spectrum and extended x-ray absorption fine structure above theKedge in CaF2

2. Fluorescence detection of exafs: Sensitivity enhancement for dilute species and thin films

3. EXAFS in photoelectron yield spectra at K edges of Cu, Ni, and Ge

4. Total-electron-yield current measurements for near-surface extended x-ray-absorption fine structure

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