Critical assessment of enhancement factor measurements in surface-enhanced Raman scattering on different substrates-Reference-Cited by-同舟云学术

Critical assessment of enhancement factor measurements in surface-enhanced Raman scattering on different substrates

Published:2015 Issue:33 Volume:17 Page:21294-21301
ISSN:1463-9076
Container-title:Physical Chemistry Chemical Physics
language:en
Short-container-title:Phys. Chem. Chem. Phys.

Author:

Rodrigues Daniel C.¹²³⁴,de Souza Michele L.¹²³⁴,Souza Klester S.¹²³⁴,dos Santos Diego P.⁵⁶⁷⁸⁴,Andrade Gustavo F. S.⁹¹⁰¹¹¹²¹³,Temperini Marcia L. A.¹²³⁴

Affiliation:

1. Laboratório de Espectroscopia Molecular

2. Instituto de Química, Universidade de São Paulo

3. São Paulo

4. Brazil

5. Departamento de Físico-Química

6. Instituto de Química

7. Universidade Estadual de Campinas

8. Campinas

9. Laboratório de Nanoestruturas Plasmônicas

10. Núcleo de Espectroscopia e Estrutura Molecular (NEEM)

11. Departamento de Química

12. Universidade Federal de Juiz de Fora

13. Juiz de Fora

Abstract

The SERS enhancement factor (SERS-EF) is one of the most important parameters that characterizes the ability of a given substrate to enhance the Raman signal for SERS applications. The comparison between dynamic and static substrates, however, should not be performed in sense of SERS-EF.

Funder

São Paulo Research Foundation

Publisher

Royal Society of Chemistry (RSC)

Subject

Physical and Theoretical Chemistry,General Physics and Astronomy

Link

http://pubs.rsc.org/en/content/articlepdf/2015/CP/C4CP05080K

Reference43 articles.

1. K. Chang and T. E.Furtak, Surface Enhanced Raman Scattering, Plenum Press, New York, 1982

2. R. Aroca , Surface-Enhanced Vibrational Spectroscopy, John Wiley & Sons, New York, 2006

3. E. C. Le Ru and P. G.Etchegoin, Principles of Surface-Enhanced Raman Spectroscopy: and related plasmonic effects, Elsevier, Amsterdam, 2009