Effects of temperature, mechanical motion and source positional jitter on the resolving power of beamline 02B at the SSRF

Abstract

A detailed analysis of the effects of temperature excursions, instrumental mechanical motion and source position jitter on the energy-resolving power of beamline 02B at the Shanghai Synchrotron Radiation Facility (SSRF) is presented in this study. This beamline uses a bending-magnet-based source and includes a variable-line-spacing grating monochromator with additional optics. Expressions are derived for the monochromator output photon energy shifts for each of the performance challenges considered. The calculated results indicate that measured temperature excursions of ±1 K produce an energy shift of less than 11% of the system's energy resolution. Mechanical displacements and vibrations measured at amplitudes of less than 0.5 µm produce changes of less than 5%, while measured source location jitter results in a change of less than 10%. Spectroscopic test experiments at 250 and 400 eV provide energy resolutions of over 104. This analysis, combined with the measured results, confirms the operational stability of the beamline, indicating that it meets the performance requirements for experimental use.