Abstract
Orientation maps similar to electron backscatter diffraction maps can be obtained in a transmission electron microscope. A method of such mapping by automatic indexing of electron diffraction patterns has been proposed recently. The procedure is relatively simple and fast but it does not avoid the 180° ambiguity. Using tests on simulated patterns, it is shown that under current practice automatic indexing may give a considerable fraction of erroneous solutions. Optimization of measurement conditions leading to a reduction of that fraction is considered.
Publisher
International Union of Crystallography (IUCr)
Subject
General Biochemistry, Genetics and Molecular Biology
Cited by
18 articles.
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