Attentive context and semantic enhancement mechanism for printed circuit board defect detection with two-stage and multi-stage object detectors
Author:
Funder
The Natural Science Foundation of China
Publisher
Springer Science and Business Media LLC
Link
https://www.nature.com/articles/s41598-024-69207-8.pdf
Reference57 articles.
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3. Rau, H. & Wu, C.-H. Automatic optical inspection for detecting defects on printed circuit board inner layers. Int. J. Adv. Manuf. Technol. 25, 940–946 (2005).
4. Moganti, M. & Ercal, F. Automatic PCB inspection systems. IEEE Potentials 14, 6–10 (1995).
5. Ibrahim, Z. & Al-Attas, S. A. R. Wavelet-based printed circuit board inspection system. Int. J. Signal Process. 1, 73–79 (2004).
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