Improved Fault Diagnosis Using Dynamic Kernel Scatter-Difference-Based Discriminant Analysis
Author:
Affiliation:
1. Chemical Engineering Sciences, Indian Institute of Chemical Technology, Hyderabad, India, and Department of Chemical Engineering, Indian Institute of Technology Bombay, Mumbai, India
Publisher
American Chemical Society (ACS)
Subject
Industrial and Manufacturing Engineering,General Chemical Engineering,General Chemistry
Link
https://pubs.acs.org/doi/pdf/10.1021/ie902019h
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1. Statistical process monitoring and disturbance diagnosis in multivariable continuous processes
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