Oxidation and Reduction Products of X Irradiation at 10 K in Sucrose Single Crystals: Radical Identification by EPR, ENDOR, and DFT-Reference-Cited by-同舟云学术

Oxidation and Reduction Products of X Irradiation at 10 K in Sucrose Single Crystals: Radical Identification by EPR, ENDOR, and DFT

Published:2009-11-19 Issue:1 Volume:114 Page:666-674
ISSN:1520-6106
Container-title:The Journal of Physical Chemistry B
language:en
Short-container-title:J. Phys. Chem. B

Author:

De Cooman Hendrik¹,Pauwels Ewald¹,Vrielinck Henk¹,Sagstuen Einar¹,Waroquier Michel¹,Callens Freddy¹

Affiliation:

1. Department of Solid State Sciences, Ghent University, Krijgslaan 281-S1, B-9000 Gent, Belgium, Center for Molecular Modeling, Ghent University, Technologiepark 903, B-9052 Zwijnaarde, Belgium, and Department of Physics, University of Oslo, P.O. Box 1048 Blindern, N-0316 Oslo, Norway

Publisher

American Chemical Society (ACS)

Subject

Materials Chemistry,Surfaces, Coatings and Films,Physical and Theoretical Chemistry

Link

https://pubs.acs.org/doi/pdf/10.1021/jp909247z

Reference57 articles.

1. Oxidative Strand Scission of Nucleic Acids: Routes Initiated by Hydrogen Abstraction from the Sugar Moiety

2. Electron trapping in irradiated single crystals of organic compounds

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