A Single Electron Transistor on an Atomic Force Microscope Probe-Reference-Cited by-同舟云学术

A Single Electron Transistor on an Atomic Force Microscope Probe

Published:2006-04-05 Issue:5 Volume:6 Page:937-941
ISSN:1530-6984
Container-title:Nano Letters
language:en
Short-container-title:Nano Lett.

Author:

Brenning Henrik T. A.¹,Kubatkin Sergey E.¹,Erts Donats¹,Kafanov Sergey G.¹,Bauch Thilo¹,Delsing Per¹

Affiliation:

1. Microtechnology and Nanoscience, Chalmers University of Technology, SE-412 96, Gothenburg, Sweden, and Institute of Chemical Physics, University of Latvia, LV-1586, Riga, Latvia

Publisher

American Chemical Society (ACS)

Link

https://pubs.acs.org/doi/pdf/10.1021/nl052526t

Reference23 articles.

1. Scanning Single-Electron Transistor Microscopy: Imaging Individual Charges

2. Amplifying quantum signals with the single-electron transistor

3. The microscopic nature of localization in the quantum Hall effect

4. Localization of Fractionally Charged Quasi-Particles

5. First Principles Study of Work Functions of Single Wall Carbon Nanotubes

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