White Light Scanning Interferometry Adapted for Large-Area Optical Analysis of Thick and Rough Hydroxyapatite Layers-Reference-Cited by-同舟云学术

White Light Scanning Interferometry Adapted for Large-Area Optical Analysis of Thick and Rough Hydroxyapatite Layers

Published:2007-02-13 Issue:7 Volume:23 Page:3912-3918
ISSN:0743-7463
Container-title:Langmuir
language:en
Short-container-title:Langmuir

Author:

Pecheva Emilia¹,Montgomery Paul¹,Montaner Denis¹,Pramatarova Lilyana¹

Affiliation:

1. Institut d'Electronique du Solide et des Systèmes, UMR 7163, 23 rue du Loess, 67037 Strasbourg, France, and Institute of Solid State Physics, Bulgarian Academy of Sciences, 72, Tzarigradsko Chaussee Boulevard, 1784 Sofia, Bulgaria

Publisher

American Chemical Society (ACS)

Subject

Electrochemistry,Spectroscopy,Surfaces and Interfaces,Condensed Matter Physics,General Materials Science

Link

https://pubs.acs.org/doi/pdf/10.1021/la061593f

Reference17 articles.

1. Kinetics of hydroxyapatite deposition on solid substrates modified by sequential implantation of Ca and P ions

2. Kinetics of hydroxyapatite deposition on solid substrates modified by sequential implantation of Ca and P ions

3. Interferometric profiler for rough surfaces

Cited by 43 articles. 订阅此论文施引文献订阅此论文施引文献，注册后可以免费订阅5篇论文的施引文献，订阅后可以查看论文全部施引文献

1. 用于表面形貌测量的扫描白光干涉技术进展;Laser & Optoelectronics Progress;2023

2. Influence of edge effects on laser-induced surface displacement of opaque materials by photothermal interferometry;Journal of Applied Physics;2020-07-28

3. Mechanical and topographical anisotropy for human skin: Ageing effect;Journal of the Mechanical Behavior of Biomedical Materials;2020-03

4. 2500-Channel single-shot areal profilometer using hyperspectral interferometry with a pinhole array;Optics and Lasers in Engineering;2019-11

5. High Resolution Surface Metrology Using Microsphere‐Assisted Interference Microscopy;physica status solidi (a);2019-02-21