Atomic Force Microscopy Force Mapping Analysis of an Adsorbed Surfactant above and below the Critical Micelle Concentration-Reference-Cited by-同舟云学术

Atomic Force Microscopy Force Mapping Analysis of an Adsorbed Surfactant above and below the Critical Micelle Concentration

Published:2018-05-28 Issue:25 Volume:34 Page:7223-7239
ISSN:0743-7463
Container-title:Langmuir
language:en
Short-container-title:Langmuir

Author:

Hamon J. J.¹,Tabor Rico F.²^ORCID,Striolo Alberto³^ORCID,Grady Brian P.¹^ORCID

Affiliation:

1. School of Chemical, Biological and Materials Engineering and Institute of Applied Surfactant Research, University of Oklahoma, Norman, Oklahoma 73019, United States

2. School of Chemistry, Monash University, Wellington Road, Clayton, Victoria 3800, Australia

3. Department of Chemical Engineering, University College London, London WC1E 7JE, U.K.

Funder

Engineering and Physical Sciences Research Council

Colgate-Palmolive Company

Sasol

Australian Research Council

Division of Civil, Mechanical and Manufacturing Innovation

American Australian Association

Ecolab

Clorox Company

Huntsman Corporation

Church and Dwight Co., Inc.

Flotek Industries, Inc.

Procter and Gamble Company

Colonial Chemical, Inc.

Shell Global Solutions

Publisher

American Chemical Society (ACS)

Subject

Electrochemistry,Spectroscopy,Surfaces and Interfaces,Condensed Matter Physics,General Materials Science

Link

https://pubs.acs.org/doi/pdf/10.1021/acs.langmuir.8b00574

Reference65 articles.

1. Influence of Surface Roughness on Cetyltrimethylammonium Bromide Adsorption from Aqueous Solution

2. Experimental Studies on the Adsorption of Two Surfactants on Solid−Aqueous Interfaces: Adsorption Isotherms and Kinetics

3. Effect of Adsorbed Layer Surface Roughness on the QCM-D Response: Focus on Trapped Water

4. Separation of Bulk Effects and Bound Mass during Adsorption of Surfactants Probed by Quartz Crystal Microbalance with Dissipation: Insight into Data Interpretation

5. Neutron Reflection from Hexadecyltrimethylammonium Bromide Adsorbed on Smooth and Rough Silicon Surfaces

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