New Approaches to the Structural Characterization of Zeolites: High Resolution Electron Microscopy and Optical Diffractometry-Reference-Cited by-同舟云学术

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New Approaches to the Structural Characterization of Zeolites: High Resolution Electron Microscopy and Optical Diffractometry

Published:1983-05-17 Issue: Volume: Page:181-198
ISSN:0097-6156
Container-title:ACS Symposium Series
language:
Short-container-title:

Author:

THOMAS J. M.¹,MILLWARD G. R.¹,RAMADAS S.¹,AUDIER M.²

Affiliation:

1. University of Cambridge, Department of Physical Chemistry, Cambridge CB2 1EP, England

2. Institute National Polytechnique de Grenoble, Ecole Nationale Superieure d'Electrochimie et d'Electrometallurgie, Laboratoire d'Adsorption et Reastion de Gas sur Solides, ERA CNRS No. 368, Saint-Martin-d'Heres, France

Publisher

AMERICAN CHEMICAL SOCIETY

Link

https://pubs.acs.org/doi/pdf/10.1021/bk-1983-0218.ch011

Cited by 9 articles. 订阅此论文施引文献订阅此论文施引文献，注册后可以免费订阅5篇论文的施引文献，订阅后可以查看论文全部施引文献

1. Die Einführung der American Studies als kulturpolitisches Steuerungsinstrument: die Vermittlung des Modells Amerika;American Studies oder Amerikanistik?;1999

2. Synthesis and Characterization of an Aluminophosphate Material With A1PO-15 Framework Type Structure;Studies in Surface Science and Catalysis;1994

3. Advances in The Structural Analysis of Zeolites, Zeolitic Precursors and Their Analogues;Studies in Surface Science and Catalysis;1989

4. Identification of Molecular Sieve Structures;Molecular Sieves;1989

5. Chapter IV: Potential Members of the Pentasil Family of High-Silica Zeolites;Studies in Surface Science and Catalysis;1987

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