High-Density, Covalent Attachment of DNA to Silicon Wafers for Analysis by MALDI-TOF Mass Spectrometry-Reference-Cited by-同舟云学术

High-Density, Covalent Attachment of DNA to Silicon Wafers for Analysis by MALDI-TOF Mass Spectrometry

Published:1997-07-01 Issue:13 Volume:69 Page:2438-2443
ISSN:0003-2700
Container-title:Analytical Chemistry
language:en
Short-container-title:Anal. Chem.

Author:

O'Donnell Maryanne J.¹,Tang Kai¹,Köster Hubert¹,Smith Cassandra L.¹,Cantor Charles R.¹

Affiliation:

1. Sequenom Inc., 11555 Sorrento Valley Road, San Diego, California 92121, Department of Biochemistry and Molecular Biology, University of Hamburg, Martin-Luther-King Platz, 20146 Hamburg, Germany, and Center for Advanced Biotechnology, Boston University, Boston, Massachusetts 02215

Publisher

American Chemical Society (ACS)

Subject

Analytical Chemistry

Link

https://pubs.acs.org/doi/pdf/10.1021/ac961007v

Reference37 articles.

1. Genetic analysis of amplified DNA with immobilized sequence-specific oligonucleotide probes.

2. DNA sequencing by hybridization: 100 bases read by a non-gel-based method.

3. Enhanced DNA sequencing by hybridization.

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