Ultrathin Films of Poly(ethylene oxides) on Oxidized Silicon. 1. Spectroscopic Characterization of Film Structure and Crystallization Kinetics
Author:
Affiliation:
1. NSF MRSEC Center on Polymer Interfaces and Macromolecular Assemblies (CPIMA) and Department of Chemical Engineering, Stanford University, Stanford, California 94305-5025
Publisher
American Chemical Society (ACS)
Subject
Materials Chemistry,Inorganic Chemistry,Polymers and Plastics,Organic Chemistry
Link
https://pubs.acs.org/doi/pdf/10.1021/ma020685i
Reference71 articles.
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4. Lithography using ultrathin resist films
5. Thin-film media—Current and future technology
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