Low-Energy Electron Damage to Condensed-Phase Deoxyribose Analogues Investigated by Electron Stimulated Desorption of H- and Electron Energy Loss Spectroscopy-Reference-Cited by-同舟云学术

Low-Energy Electron Damage to Condensed-Phase Deoxyribose Analogues Investigated by Electron Stimulated Desorption of H- and Electron Energy Loss Spectroscopy

Published:1999-07-16 Issue:31 Volume:103 Page:6611-6619
ISSN:1520-6106
Container-title:The Journal of Physical Chemistry B
language:en
Short-container-title:J. Phys. Chem. B

Author:

Antic D.¹,Parenteau L.¹,Lepage M.¹,Sanche L.¹

Affiliation:

1. Groupe du Conseil de Recherches Médicales du Canada en Sciences des Radiations, Faculté de Médecine, Université de Sherbrooke, Québec, J1H 5N4, Canada

Publisher

American Chemical Society (ACS)

Subject

Materials Chemistry,Surfaces, Coatings and Films,Physical and Theoretical Chemistry

Link

https://pubs.acs.org/doi/pdf/10.1021/jp990686l

Reference92 articles.

1. Electronic aging and related electron interactions in thin-film dielectrics

2. Electron Stimulated Desorption of H2 from Chemisorbed Molecular Monolayers

3. Bond-selective dissociation of alkanethiol based self-assembled monolayers adsorbed on gold substrates, using low-energy electron beams

4. Oxidation of hydrogen-passivated silicon surfaces induced by dissociative electron attachment to physisorbed H2O

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