Interpreting the Presence of an Additional Oxide Layer in Analysis of Metal Oxides–Metal Interfaces in Atom Probe Tomography-Reference-Cited by-同舟云学术

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Interpreting the Presence of an Additional Oxide Layer in Analysis of Metal Oxides–Metal Interfaces in Atom Probe Tomography

Published:2018-12-20 Issue:2 Volume:123 Page:1313-1319
ISSN:1932-7447
Container-title:The Journal of Physical Chemistry C
language:en
Short-container-title:J. Phys. Chem. C

Author:

Bachhav Mukesh¹^ORCID,Pawar Gorakh¹^ORCID,Vurpillot Francois²,Danoix Raphaële²,Danoix Frédéric²,Hannoyer Beatrice²,Dong Yan³,Marquis Emmanuelle³

Affiliation:

1. Idaho National Laboratory, Idaho Falls, Idaho 83415, United States

2. Normandie Univ, UNIROUEN, INSA Rouen, CNRS, GPM, 76000 Rouen, France

3. Department of Materials Science and Engineering, University of Michigan, Ann Arbor, Michigan 48109, United States

Funder

Department of Energy, Office of Nuclear Energy under DOE Idaho Operations Office

Publisher

American Chemical Society (ACS)

Subject

Surfaces, Coatings and Films,Physical and Theoretical Chemistry,General Energy,Electronic, Optical and Magnetic Materials

Link

https://pubs.acs.org/doi/pdf/10.1021/acs.jpcc.8b10895

Reference60 articles.

1. Atom Probe Tomography 2012

2. Atom probe tomography

3. Three-Dimensional Atom-Probe Tomography: Advances and Applications

4. Atom probe tomography today

5. Field-emitter arrays for vacuum microelectronics

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