Thickness-Dependent Monoclinic Phases and Piezoelectric Properties Observed in Polycrystalline (Pb0.94La0.04)(Zr0.60Ti0.40)O3 Thin Films-Reference-Cited by-同舟云学术

Thickness-Dependent Monoclinic Phases and Piezoelectric Properties Observed in Polycrystalline (Pb0.94La0.04)(Zr0.60Ti0.40)O3 Thin Films

Published:2015-07-21 Issue:30 Volume:119 Page:17487-17492
ISSN:1932-7447
Container-title:The Journal of Physical Chemistry C
language:en
Short-container-title:J. Phys. Chem. C

Author:

Zhang SiQi¹,Zheng Fu¹,Jin ChenFei¹,Fei WeiDong²

Affiliation:

1. Department of Physics, Harbin Institute of Technology, Harbin 150001, People’s Republic of China

2. Department of Physics and Chemistry, School of Materials Science and Engineering, Harbin Institute of Technology, Harbin 150001, People’s Republic of China

Publisher

American Chemical Society (ACS)

Subject

Surfaces, Coatings and Films,Physical and Theoretical Chemistry,General Energy,Electronic, Optical and Magnetic Materials

Link

https://pubs.acs.org/doi/pdf/10.1021/acs.jpcc.5b06517

Reference43 articles.

1. Ferroelectric, dielectric and piezoelectric properties of ferroelectric thin films and ceramics

2. Characterization of the Microstructural and Piezoelectric Properties of PbTiO3 Thin Films Synthesized by Liquid-Phase Deposition

3. Characterization of PLZT thin film prepared by photochemical deposition using photosensitive metal-organic precursors

4. Effect of Mechanical Boundary Conditions on Phase Diagrams of Epitaxial Ferroelectric Thin Films

5. Effects of external mechanical loading on phase diagrams and dielectric properties in epitaxial ferroelectric thin films with anisotropic in-plane misfit strains

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