Amorphization Toughening Induced by Microcracks in SiO<sub>2</sub> Thin Films-Reference-Cited by-同舟云学术

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Amorphization Toughening Induced by Microcracks in SiO₂ Thin Films

Published:2023-05-01 Issue:18 Volume:127 Page:8825-8832
ISSN:1932-7447
Container-title:The Journal of Physical Chemistry C
language:en
Short-container-title:J. Phys. Chem. C

Author:

Gao Yuxiang¹^ORCID,Gao Yixuan¹^ORCID,Zhang Yu-Yang¹^ORCID,Du Shixuan¹²³^ORCID

Affiliation:

1. Chinese Academy of Sciences, Institute of Physics and University of Chinese Academy of Sciences, Beijing 100190, China

2. Beijing National Center for Condensed Matter Physics, Beijing 100190, China

3. Songshan Lake Materials Laboratory, Dongguan 523808, China

Funder

National Key Research and Development Program of China

Central University Basic Research Fund of China

National Natural Science Foundation of China

Chinese Academy of Sciences

CAS Project for Young Scientists in Basic Research

Publisher

American Chemical Society (ACS)

Subject

Surfaces, Coatings and Films,Physical and Theoretical Chemistry,General Energy,Electronic, Optical and Magnetic Materials

Link

https://pubs.acs.org/doi/pdf/10.1021/acs.jpcc.3c01189

Reference53 articles.

1. Electromagnetic properties of Si–C–N based ceramics and composites

2. A machine learning framework for damage mechanism identification from acoustic emissions in unidirectional SiC/SiC composites

3. Research and prospect of ceramics for automotive disc-brakes

4. Emerging Ceramic-based Materials for Dentistry

5. Design high-entropy carbide ceramics from machine learning

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