XANES Studies of Zinc Tin Oxide Films Deposited by Atomic Layer Deposition: Revealing Process-Structure Relationships for Amorphous Oxide Semiconductors-Reference-Cited by-同舟云学术

XANES Studies of Zinc Tin Oxide Films Deposited by Atomic Layer Deposition: Revealing Process-Structure Relationships for Amorphous Oxide Semiconductors

Published:2022-12-22 Issue:1 Volume:127 Page:338-349
ISSN:1932-7447
Container-title:The Journal of Physical Chemistry C
language:en
Short-container-title:J. Phys. Chem. C

Author:

Trejo Orlando¹,Cho Tae H.¹,Sainio Sami²³,Dasgupta Neil P.¹⁴^ORCID

Affiliation:

1. Department of Mechanical Engineering, University of Michigan, Ann Arbor, Michigan 48109, United States

2. Department Stanford Synchrotron Radiation Lightsource, SLAC National Accelerator Laboratory, Menlo Park, California 94025, United States,

3. Microelectronics Research Unit, Faculty of Information Technology and Electrical Engineering, University of Oulu, 90570 Oulu, Finland

4. Department of Materials Science & Engineering, University of Michigan, Ann Arbor, Michigan 48109, United States

Funder

Basic Energy Sciences

H2020 Marie Sklodowska-Curie Actions

Office of Energy Efficiency and Renewable Energy

Division of Civil, Mechanical and Manufacturing Innovation

Publisher

American Chemical Society (ACS)

Subject

Surfaces, Coatings and Films,Physical and Theoretical Chemistry,General Energy,Electronic, Optical and Magnetic Materials

Link

https://pubs.acs.org/doi/pdf/10.1021/acs.jpcc.2c05656

Reference67 articles.

1. Metal oxides for optoelectronic applications

2. Amorphous oxide alloys as interfacial layers with broadly tunable electronic structures for organic photovoltaic cells

3. Research Advances of Amorphous Metal Oxides in Electrochemical Energy Storage and Conversion

4. Atomic layer deposition and first principles modeling of glassy Li3BO3–Li2CO3 electrolytes for solid-state Li metal batteries

5. Synaptic Emulation via Ferroelectric P(VDF-TrFE) Reinforced Charge Trapping/Detrapping in Zinc–Tin Oxide Transistor