Hard X-ray Detection Using a Single 100 nm Diameter Nanowire-Reference-Cited by-同舟云学术

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Hard X-ray Detection Using a Single 100 nm Diameter Nanowire

Published:2014-12-01 Issue:12 Volume:14 Page:7071-7076
ISSN:1530-6984
Container-title:Nano Letters
language:en
Short-container-title:Nano Lett.

Author:

Wallentin Jesper¹,Osterhoff Markus¹,Wilke Robin N.¹,Persson Karl-Magnus²,Wernersson Lars-Erik²,Sprung Michael³,Salditt Tim¹

Affiliation:

1. Institute for X-ray Physics, University of Göttingen, Friedrich-Hund-Platz 1, 37077 Göttingen, Germany

2. Department of Electrical and Information Technologies, Lund University, Lund S-221 00, Sweden

3. DESY, Notkestrasse 85, 22607 Hamburg, Germany

Funder

Deutsche Forschungsgemeinschaft

Knut och Alice Wallenbergs Stiftelse

Publisher

American Chemical Society (ACS)

Subject

Mechanical Engineering,Condensed Matter Physics,General Materials Science,General Chemistry,Bioengineering

Link

https://pubs.acs.org/doi/pdf/10.1021/nl5040545

Reference43 articles.

1. Sub-5 nm hard x-ray point focusing by a combined Kirkpatrick-Baez mirror and multilayer zone plate

2. Breaking the 10 nm barrier in hard-X-ray focusing

3. Hard x-ray nanobeam characterization by coherent diffraction microscopy

4. Soft X-ray microscopy at a spatial resolution better than 15 nm

5. Pixel detectors for diffraction-limited storage rings

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1. Analytical and Numerical Investigation of Nanowire Transistor X-ray Detector;Materials;2023-03-27

2. Microscopic Understanding of the Growth and Structural Evolution of Narrow Bandgap III–V Nanostructures;Materials;2022-03-04

3. Nanoscale X-ray detectors based on individual CdS, SnO2 and ZnO nanowires;Nuclear Instruments and Methods in Physics Research Section A: Accelerators, Spectrometers, Detectors and Associated Equipment;2021-10

4. Off-axis multilayer zone plate with 16 nm × 28 nm focus for high-resolution X-ray beam induced current imaging;Journal of Synchrotron Radiation;2021-07-22

5. Modeling the Ga/As binary system across temperatures and compositions from first principles;Physical Review Materials;2021-06-22

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