Measurement and compensation of defocusing and aberrations by Fourier processing of electron micrographs
-
Published:1971-05-27
Issue:
Volume:
Page:
-
ISSN:0080-4622
-
Container-title:Philosophical Transactions of the Royal Society of London. B, Biological Sciences
-
language:
-
Short-container-title:
您需要登录后可以查看相关数据！