A Gate-All-Around Tunneling Field-Effect Transistor with SiO2 Core and Si Shell Structure
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Published:2014-08-01
Issue:8
Volume:11
Page:1826-1832
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ISSN:1546-1955
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Container-title:Journal of Computational and Theoretical Nanoscience
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language:en
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Short-container-title:Jnl of Comp & Theo Nano
Author:
He Xiaomeng,Shi Min,Wang Cheng,Zhu Xiaoan,Zhang Xiangyu,He Jin,He Qingxing,Du Caixia,Zhong Shengju
Publisher
American Scientific Publishers
Subject
Electrical and Electronic Engineering,Computational Mathematics,Condensed Matter Physics,General Materials Science,General Chemistry