DIFFRACTION OF X-RAYS IN CRYSTALS: A TENSOR APPROACH-Reference-Cited by-同舟云学术

DIFFRACTION OF X-RAYS IN CRYSTALS: A TENSOR APPROACH

Published:2023-05-01 Issue:3 Volume:68 Page:346-357
ISSN:0023-4761
Container-title:Кристаллография
language:
Short-container-title:Kristallografiâ

Author:

Oreshko A. P.¹,Ovchinnikova E. N.¹,Dmitrienko V. E.²

Affiliation:

1. Lomonosov Moscow State University, Moscow, 119991 Russia

2. Shubnikov Institute of Crystallography, Federal Scientific Research Centre “Crystallography and Photonics,” Russian Academy of Sciences, Moscow, 119333 Russia

Abstract

The use of X-ray synchrotron radiation makes it possible to observe the polarization, spectral, and angular dependences for diffraction reflections. Their theoretical study calls for application of a tensor approach to describe the interaction of X-rays with atoms of matter. Various representations of the tensor atomic scattering amplitude, results of experimental observations of the anisotropy of resonant X-ray scattering, and the relationship of the electric and magnetic multipole moments on atoms with the properties of forbidden resonant reflections are considered.

Publisher

The Russian Academy of Sciences

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