Author:
Ask M.,Rolander U.,Lausmaa J.,Kasemo B.
Abstract
The microstructure of anodic oxide films grown on Ti–6A1–4V in H2SO4 was investigated by SEM, TEM, STEM, EDX, and AES, as a complement to a recent surface spectroscopic investigation of the same oxides by XPS, AES, and SIMS. The anodic oxide films are heterogeneous and the texture reflects the duplex microstructure (α and β phases) of the underlying metal. Porous oxide regions are observed with different appearances on α-phase and mixed-phase regions. The oxide films are essentially amorphous in the investigated thickness range 60–300 nm (in contrast to as-grown anodic films on pure Ti), but crystallize to the anatase structure upon annealing. Considerable lateral variation of the V content in the oxide is observed, reflecting the corresponding variation in the underlying metal. The results are compared with a previous, similar investigation of anodic oxides on pure Ti.
Publisher
Springer Science and Business Media LLC
Subject
Mechanical Engineering,Mechanics of Materials,Condensed Matter Physics,General Materials Science
Reference18 articles.
1. 2 Ask M. , Surface characterization of oxide films on Ti-6A1–4V alloy, Gothenburg Institute of Physics Report, GIPR-268 (1985).
2. Oxydation anodique du titane en solution sulfurique : nature, épaisseur et indice de réfraction des films formés
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