The Effects of Irradiation on Structure and Leaching of Pure and Doped Thin-Film Ceria SIMFUEL Models Prepared via Polymer-Templated Deposition

Author:

Holdsworth Alistair F.12ORCID,Feng Zizhen1,Edge Ruth3ORCID,Waters John P.4,Halman Alice M.5,Collison David1,George Kathryn2ORCID,Natrajan Louise S.1ORCID,Denecke Melissa A.13ORCID

Affiliation:

1. Department of Chemistry, The University of Manchester, Oxford Road, Manchester, Greater Manchester, M13 9PL, UK

2. Department of Chemical Engineering, The University of Manchester, Oxford Road, Manchester, Greater Manchester, M13 9PL, UK

3. Dalton Cumbrian Facility, The University of Manchester, Westlakes Science Park, Moor Row, Cumbria, CA24 3HA, UK

4. Department of Earth Sciences, The University of Manchester, Oxford Road, Manchester, Greater Manchester, M13 9PL, UK

5. School of Physical Sciences and Computing, University of Central Lancashire, Preston, Lancashire, PR1 2HE, UK

Abstract

When studying hazardous materials such as spent nuclear fuel (SNF), the minimisation of sample volumes is essential, together with the use of chemically-similar surrogates where possible. For example, the bulk behaviour of urania (UO2) can be mimicked by appropriately-engineered thin films of sufficient thickness, and inactive materials such as ceria (CeO2) can be used to study the effects within radioactive systems used to fuel nuclear fission. However, thin film properties are sensitive to the preparative method, many of which require the use of highly toxic precursors and specialised apparatus (e.g., chemical vapour deposition). To address this, we present the development of a flexible, tuneable, scalable method for the preparation of thin-film CeO2 SIMFUEL models with a thickness of ≈5 μm. The effects of γ irradiation (up to 100 kGy) and dopants including trivalent lanthanides (Ln3+) and simulant ε-particles on the structure and long-term leaching of these systems under SNF storage conditions were explored, alongside the context of this within further work. It was found that the sensitivity of CeO2 films to reduction upon irradiation, particularly in the presence of simulant ε-particles, resulted in increased leaching of Ce (as CeIII), while trivalent lanthanides (Nd3+ and Eu3+) had a minimal effect on Ce leaching.

Funder

EU Horizons 2020 Program

Nuffield Foundation

Publisher

MDPI AG

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