Material Removal Mechanisms of Polycrystalline Silicon Carbide Ceramic Cut by a Diamond Wire Saw

Author:

Yang Huyi1,Fu Ming1,Zhang Xin1,Zhu Kailin1,Cao Lei2,Hu Chunfeng2ORCID

Affiliation:

1. Nuclear Power Institute of China, Chengdu 610213, China

2. Key Laboratory of Advanced Technologies of Materials, Ministry of Education, School of Materials Science and Engineering, Southwest Jiaotong University, Chengdu 610031, China

Abstract

Polycrystalline silicon carbide (SiC) is a highly valuable material with crucial applications across various industries. Despite its benefits, processing this brittle material efficiently and with high quality presents significant challenges. A thorough understanding of the mechanisms involved in processing and removing SiC is essential for optimizing its production. In this study, we investigated the sawing characteristics and material removal mechanisms of polycrystalline silicon carbide (SiC) ceramic using a diamond wire saw. Experiments were conducted with high wire speeds of 30 m/s and a maximum feed rate of 2.0 mm/min. The coarseness value (Ra) increased slightly with the feed rate. Changes in the diamond wire during the grinding process and their effects on the grinding surface were analyzed using scanning electron microscopy (SEM), laser confocal microscopy, and focused ion beam (FIB)-transmission electron microscopy (TEM). The findings provide insights into the grinding mechanisms. The presence of ductile grinding zones and brittle fracture areas on the ground surface reveals that external forces induce dislocation and amorphization within the grain structure, which are key factors in material removal during grinding.

Funder

National Natural Sciences Foundation of China

Publisher

MDPI AG

Reference33 articles.

1. Goel, S. (2014). The Current Understanding on the Diamond Machining of Silicon Carbide. J. Phys. D. Appl. Phys., 47.

2. Automotive and Industrial Applications of Structural Ceramics in Japan;Okada;J. Eur. Ceram. Soc.,2008

3. Machining Processes of Silicon Carbide: A Review;Pawar;Rev. Adv. Mater. Sci.,2017

4. SiC Sensors: A Review;Wright;J. Phys. D. Appl. Phys.,2007

5. Diffusion of Fission Products and Radiation Damage in SiC;Malherbe;J. Phys. D. Appl. Phys.,2013

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