Characterization of Sand and Dust Pollution Degradation Based on Sensitive Structure of Microelectromechanical System Flow Sensor

Author:

Chen Jinchuan12,Wen Xiao12,Huang Qinwen2,Ren Wanchun1,Liu Ruiwen3,He Chunhua4ORCID

Affiliation:

1. School of Information Engineering, Southwest University of Science and Technology (SWUST), 59 Qinglong Road, Mianyang 621010, China

2. Science and Technology on Reliability Physics and Application Technology of Electronic Component Laboratory, China Electronic Product Reliability, and Environmental Testing Research Institute, Guangzhou 510610, China

3. Institute of Microelectronics Chinese Academy of Sciences, Beijing 100017, China

4. School of Computer, Guangdong University of Technology, Guangzhou 510006, China

Abstract

The effect of sand and dust pollution on the sensitive structures of flow sensors in microelectromechanical systems (MEMS) is a hot issue in current MEMS reliability research. However, previous studies on sand and dust contamination have only searched for sensor accuracy degradation due to heat conduction in sand and dust cover and have yet to search for other failure-inducing factors. This paper aims to discover the other inducing factors for the accuracy failure of MEMS flow sensors under sand and dust pollution by using a combined model simulation and sample test method. The accuracy of a flow sensor is mainly reflected by the size of its thermistor, so in this study, the output value of the thermistor value was chosen as an electrical characterization parameter to verify the change in the sensor’s accuracy side by side. The results show that after excluding the influence of heat conduction, when sand particles fall on the device, the mutual friction between the sand particles will produce an electrostatic current; through the principle of electrostatic dissipation into the thermistor, the principle of measurement leads to the resistance value becoming smaller, and when the sand dust is stationary for some time, the resistance value returns to the expected level. This finding provides theoretical guidance for finding failure-inducing factors in MEMS failure modes.

Funder

National Key R&D Program of China

National Natural Science Foundation of China

Guangdong Basic and Applied Basic Research Foundation

Basic and Applied Basic Research Foundation of Guangzhou Basic Research Program

Publisher

MDPI AG

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