Demonstration of Sensitivity of the Total-Electron-Yield Extended X-ray Absorption Fine Structure Method on Plastic Deformation of the Surface Layer

Abstract

X-ray Absorption Fine Structure Spectroscopy (XAFS) has proven instrumental for the study of atomic-scale structures across diverse materials. This study conducts a meticulous comparative analysis between total electron yield (TEY) and absorption coefficients at the K absorption edge of polycrystalline Fe and Zr60Cu20Fe20 alloy. Our findings not only highlight differences between TEY and transmission XAFS measurements but also demonstrate the capabilities and limitations inherent in these measurement modes within the context of XAFS. This article provides an experimental exploration of widely used X-ray absorption spectroscopy methods, shedding light on the nuances of TEY and transmission XAFS. Through presenting experimental results, we aim to offer insights crucial to the material science community, guiding experimentalists in optimizing measurements while raising awareness about potential misinterpretations.