The Deposition and Properties of Titanium Films Prepared by High Power Pulsed Magnetron Sputtering

Author:

Jiang Quanxin1,Ma Donglin2ORCID,Li Yantao3,Chen Changzi1

Affiliation:

1. Jingchu University of Technology, Jingmen 448000, China

2. Chengdu Normal University, Chengdu 611130, China

3. Mianyang Normal University, Mianyang 621000, China

Abstract

Titanium thin films are particularly important as electrode layers, barrier layers, or intermediate buffer layers in the semiconductor industry. In order to improve the quality of Ti thin films and the adhesion and diffraction abilities of irregular parts, this paper used high-power pulsed magnetron sputtering (HPPMS/HiPIMS) to prepare titanium thin films. The effects of different trigger voltages (700 V, 800 V, and 900 V) on plasma properties were studied, and the microstructure, mechanical properties and corrosion resistance of the films were also studied. The results showed that as the voltage increased, the grain size of the thin films gradually increased. The residual stress of the titanium films changed from compressive stress (−333 MPa) to tensile stress (55 MPa) and then to low compressive stress (−178 MPa). The hardness values were 13 GPa, 9.45 GPa and 6.62 GPa, respectively. The wear resistance of the films gradually decreased, while the toughness gradually increased. The corrosion resistance of the films decreased as well.

Funder

School level projects

Publisher

MDPI AG

Subject

General Materials Science

Reference25 articles.

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