Abstract
Based on the previous research on electromagnetic pulse coupling, which pays more attention to the front-door coupling or the back-door coupling alone, this paper analyzes the influence of an electromagnetic pulse on electronic devices and systems through the joint analysis of front-door and back-door couplings using the finite-difference time-domain method (FDTD). This specific measure is used to simplify the front-door coupling to the voltage source injection, which occurs simultaneously with plane wave irradiation. This coupling scheme of the front door and back door with the voltage source and plane wave acting simultaneously is rarely seen in previous analyses, which also gives consideration to the working state of the circuit. Although the equivalent circuit model is widely used, it cannot effectively reflect the working state of the diode circuit under the conditions of large injection and high frequency. In view of the limited application scenarios of the traditional equivalent circuit model, which cannot accurately describe the internal response characteristics of the diode under different electromagnetic pulse coupling, this paper introduces an improved equivalent circuit model based on the physical model. Taking the Positive Intrinsic-Negative (PIN) limiter as the target, this paper analyzes the influence of the front-door and back-door joint coupling on its performance under different electromagnetic pulses and then gives protection suggestions.
Funder
National Key Laboratory of Science and Technology on Space Microwave
Subject
Electrical and Electronic Engineering,Computer Networks and Communications,Hardware and Architecture,Signal Processing,Control and Systems Engineering
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