An estimation of EDXRF spectrometer properties, based on a two-layer composite Si-Ge detector-Reference-Cited by-同舟云学术

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An estimation of EDXRF spectrometer properties, based on a two-layer composite Si-Ge detector

Published:2012-06-15 Issue:5 Volume:41 Page:298-303
ISSN:0049-8246
Container-title:X-Ray Spectrometry
language:en
Short-container-title:X-Ray Spectrom.

Author:

Portnoy A. Yu.¹,Pavlinsky G. V.²,Gorbunov M. S.²,Sidorova Yu. I.¹

Affiliation:

1. Irkutsk State University of Railway Engineering; 15 Chernishevsky str.; Irkutsk; 664074; Russia

2. Institute of Applied Physics; Irkutsk State University; 20 Gagarin blvd.; Irkutsk; 664003; Russia

Publisher

Wiley

Subject

Spectroscopy

Reference40 articles.

1. The complete spectral response for EDXRF systems—calculation by Monte Carlo and analysis applications. 1—homogeneous samples

2. An improved Si(Li) detector response function

3. Monte Carlo simulation of backscattered peaks in secondary target energy-dispersive x-ray spectra

4. Monte Carlo simulation of conventional and synchrotron energy-dispersive x-ray spectrometers

5. Polarization effects on multiple scattering gamma transport

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1. X-Ray Fluorescence Spectrometry: Current Status and Prospects of Development;Journal of Analytical Chemistry;2023-11

2. X-Ray Fluorescence Spectrometry: Current Status and Prospects of Development;Журнал аналитической химии;2023-11-01

3. 2013 Atomic spectrometry update—A review of advances in X-ray fluorescence spectrometry;Journal of Analytical Atomic Spectrometry;2013

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