Rapid thermal annealing of MIS GaAs schottky barriers-Reference-Cited by-同舟云学术

登录注册会员服务联系我们

Rapid thermal annealing of MIS GaAs schottky barriers

Published:1991-10-16 Issue:2 Volume:127 Page:573-576
ISSN:0031-8965
Container-title:Physica Status Solidi (a)
language:de
Short-container-title:Phys. Stat. Sol. (a)

Author:

Eftekhari G.

Publisher

Wiley

Subject

Condensed Matter Physics,Electronic, Optical and Magnetic Materials,Condensed Matter Physics,Electronic, Optical and Magnetic Materials

Reference11 articles.

1. Annealing of Ion‐Implanted GaAs in a Controlled Atmosphere

2. Enhanced protection of GaAs against thermal surface degradation by encapsulated annealing in an arsine ambient

3. , , , and , in: Rapid Thermal Processing of Electronic Materials, Ed. and , MRS publication, vol. 92, 381 (1987).

4. Characterization of tantalum silicide contacts on GaAs

5. Rapid thermal annealing of Si implanted GaAs for power field‐effect transistors

Cited by 2 articles. 订阅此论文施引文献订阅此论文施引文献，注册后可以免费订阅5篇论文的施引文献，订阅后可以查看论文全部施引文献

1. Electron trapping in thin oxide on GaAs and InP at 77 K;Journal of Vacuum Science & Technology B: Microelectronics and Nanometer Structures;1995-03

2. Electrical characteristics of selenium-treated GaAs MIS Schottky diodes;Semiconductor Science and Technology;1993-03-01

同舟云学术

1.学者识别学者识别

2.学术分析学术分析

3.人才评估人才评估

"同舟云学术"是以全球学者为主线，采集、加工和组织学术论文而形成的新型学术文献查询和分析系统，可以对全球学者进行文献检索和人才价值评估。用户可以通过关注某些学科领域的顶尖人物而持续追踪该领域的学科进展和研究前沿。经过近期的数据扩容，当前同舟云学术共收录了国内外主流学术期刊6万余种，收集的期刊论文及会议论文总量共计约1.5亿篇，并以每天添加12000余篇中外论文的速度递增。我们也可以为用户提供个性化、定制化的学者数据。欢迎来电咨询！咨询电话：010-8811{复制后删除}0370

www.globalauthorid.com

TOP