1. Secondary Ion Mass Spectrometry. A Practical Handbook for Depth Profiling and Bulk Impurity Analysis. John Wiley: Chichester, 1989; p. 543.
2. IMS-6f User's Guide. Cameca: France; 1995.
3. Tables of spatial distribution of ion-implanted dopant. Minsk: Byelarussian State University, 1980 (In Russian).
4. In Proceedings of Tenth International Conference on Secondary Ion Mass Spectrometry, SIMS X, (eds). John Wiley: Chichester, 1997; pp. 553-556.
5. Proceedings of Tenth International Conference on Secondary Ion Mass Spectrometry, SIMS X, (eds). John Wiley: Chichester, 1997; pp. 685-688.