Measuring the electronic structure of disordered overlayers by electron momentum spectroscopy: the Cu/Si interface-Reference-Cited by-同舟云学术

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Measuring the electronic structure of disordered overlayers by electron momentum spectroscopy: the Cu/Si interface

Published:2006 Issue:8 Volume:38 Page:1236-1241
ISSN:0142-2421
Container-title:Surface and Interface Analysis
language:en
Short-container-title:Surf. Interface Anal.

Author:

Nixon K. L.,Vos M.,Bowles C.,Ford M. J.

Publisher

Wiley

Subject

Materials Chemistry,Surfaces, Coatings and Films,Surfaces and Interfaces,Condensed Matter Physics,General Chemistry

Reference23 articles.

1. . Electron Momentum Spectroscopy. Kluwer Academic/Plenum: New York, 1999.

2. Spectral momentum density of electrons in copper

3. The Spectral Momentum Density of Aluminium, Copper and Gold Measured by Electron Momentum Spectroscopy

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1. Effects of intermetallic compound layer thickness on the mechanical properties of silicon-copper interface;Materials & Design;2021-12

2. Theory of laser-assisted electron momentum spectroscopy: Beyond the Volkov wave Born approximation;Journal of Physics: Conference Series;2011-04-01

3. Laser-assisted electron momentum spectroscopy;Physical Review A;2010-08-12

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