Analysis of Carrier Transport in Quantum Dot/Metal‐Oxide Phototransistors via Light‐Mediated Interfacial Modeling-Reference-Cited by-同舟云学术

Analysis of Carrier Transport in Quantum Dot/Metal‐Oxide Phototransistors via Light‐Mediated Interfacial Modeling

Author:

Park Joon Bee¹,Kim Jaehyun²,Jang Young Woo¹,Park Hun‐Bum¹,Yang Seong Hwan¹,Kim Dae‐Hwan³,Kim Myunggil⁴,Facchetti Antonio²⁵,Park Sung Kyu¹^ORCID

Affiliation:

1. School of Electrical and Electronics Engineering Chung‐Ang University Seoul 06980 Korea

2. Department of Chemistry and Materials Research Center Northwestern University 2145 Sheridan Road Evanston IL 60208 USA

3. School of Electrical Engineering Kookmin University Seoul 02707 South Korea

4. School of Advanced Materials Science and Engineering Sungkyunkwan University Suwon 16419 Korea

5. Flexterra Corporation 8025 Lamon Avenue Skokie IL 60077 USA

Publisher

Wiley

Subject

Atomic and Molecular Physics, and Optics,Electronic, Optical and Magnetic Materials

Link

Reference56 articles.

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