Signatures of top versus bottom illuminations and their predicted implications for infrared transmission microspectroscopy

Author:

Kong Beibei1ORCID,Blümel Reinhold2,Ylä‐Oijala Pasi3,Wallén Henrik3,Sihvola Ari3,Kohler Achim1

Affiliation:

1. Faculty of Science and Technology Norwegian University of Life Sciences Aas Norway

2. Department of Physics Wesleyan University Middletown Connecticut USA

3. Department of Electronics and Nanoengineering Aalto University Espoo Finland

Abstract

AbstractSince both top and bottom illuminations are widely used in infrared transmission measurements, in this paper, we study the effects of different illuminations on the signatures in infrared microspectroscopy. By simulating a series of dielectric samples, we show that their extinction efficiency, , remains unchanged when the direction of the incident plane wave is reversed, even though the field distributions both inside and outside of the sample may be dramatically different. We find features in that are correlated with whispering gallery modes for one beam direction and correspond to completely different field distributions for the opposite beam direction. In addition, by linking the optical theorem and the reciprocity relation of far‐field scattered field, we rigorously prove the invariance of for arbitrary dielectric targets under opposite plane‐wave illuminations. Furthermore, we show the difference in the apparent absorbance spectrum for opposite beam directions when considering numerical apertures.

Funder

Norges Forskningsråd

Publisher

Wiley

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