The Systematic Determination of Crystallographic Orientations from Three Octahedral Traces on a Plane Surface-Reference-Cited by-同舟云学术

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The Systematic Determination of Crystallographic Orientations from Three Octahedral Traces on a Plane Surface

Published:1963 Issue:5 Volume:3 Page:824-858
ISSN:0370-1972
Container-title:physica status solidi (b)
language:de
Short-container-title:phys. stat. sol. (b)

Author:

Drazin M. P.,Otte H. M.

Publisher

Wiley

Subject

Condensed Matter Physics,Electronic, Optical and Magnetic Materials

Reference11 articles.

1. Structure of Metals, McGraw-Hill, New York 1952.

2. X-ray Diffraction, Addison-Wesley, New York 1956.

3. The variation of the surface tension of nickel with crystallographic orientation

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1. Electron Diffraction Modes and Applications;Transmission Electron Microscopy;1997

2. Computer aided analysis on twinning plane of InSb single crystal;Materials Letters;1995-07

3. The Determination of Local Texture by Electron Diffraction–A Tutorial Review;Textures and Microstructures;1993-01-01

4. Analytical Electron Microscopy;Transmission Electron Microscopy;1993

5. Practical aspects of {111} trace analysis;Materials Characterization;1990-04

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