Emerging Scanning Probe–Based Setups for Advanced Nanoelectronic Research-Reference-Cited by-同舟云学术

Emerging Scanning Probe–Based Setups for Advanced Nanoelectronic Research

Published:2019-08-20 Issue:18 Volume:30 Page:1902776
ISSN:1616-301X
Container-title:Advanced Functional Materials
language:en
Short-container-title:Adv. Funct. Mater.

Author:

Hui Fei¹²,Wen Chao¹,Chen Shaochuan¹,Koren Elad²,Dechter Rimma³,Lewis David³,Lanza Mario¹^ORCID

Affiliation:

1. Institute of Functional Nano & Soft Materials (FUNSOM)Collaborative Innovation Center of Suzhou Nanoscience and TechnologySoochow University 199 Ren‐Ai Road, Building 910 Suzhou 215123 China

2. Department of Materials Science and EngineeringTechnion—Israel Institute of Technology Haifa 32000 Israel

3. Nanonics Imaging Ltd. Har HotzvimHi‐Tech Park, Beit Bynet Jerusalem 97775 Israel

Funder

Ministry of Education of the People's Republic of China

National Natural Science Foundation of China

Ministry of Finance

Publisher

Wiley

Subject

Electrochemistry,Condensed Matter Physics,Biomaterials,Electronic, Optical and Magnetic Materials

Link

https://onlinelibrary.wiley.com/doi/pdf/10.1002/adfm.201902776

Reference159 articles.

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5. Atomic structure of “multilayer silicene” grown on Ag(111): Dynamical low energy electron diffraction analysis

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