Reactively magnetron sputtered Bi2 O3 thin films: Analysis of structure, optoelectronic, interface, and photovoltaic properties-Reference-Cited by-同舟云学术

Reactively magnetron sputtered Bi2 O3 thin films: Analysis of structure, optoelectronic, interface, and photovoltaic properties

Published:2013-11-12 Issue:1 Volume:211 Page:93-100
ISSN:1862-6300
Container-title:physica status solidi (a)
language:en
Short-container-title:Phys. Status Solidi A

Author:

Morasch Jan¹,Li Shunyi¹,Brötz Joachim²,Jaegermann Wolfram¹,Klein Andreas¹

Affiliation:

1. Technische Universität Darmstadt, Institute of Materials Science; Surface Science Division; Jovanka-Bonschits-Straße 2 64287 Darmstadt Germany

2. Technische Universität Darmstadt; Institute of Materials Science; Structure Research Division; Alarich-Weiss-Strasse 2 64287 Darmstadt Germany

Funder

German Science Foundation

Publisher

Wiley

Subject

Materials Chemistry,Electrical and Electronic Engineering,Surfaces, Coatings and Films,Surfaces and Interfaces,Condensed Matter Physics,Electronic, Optical and Magnetic Materials

Link

http://onlinelibrary.wiley.com/wol1/doi/10.1002/pssa.201330216/fullpdf

Reference39 articles.

1. Optical properties of bismuth trioxide thin films

2. Electrical properties of the α, β, γ, and δ phases of bismuth sesquioxide

3. Oxide ion conducting solid electrolytes based on Bi2O3

4. New ε-Bi2O3 Metastable Polymorph

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