X‐Ray photoelectron valence band spectra from semiconductors Bi2Te3 and Sb2Te3-Reference-Cited by-同舟云学术

X‐Ray photoelectron valence band spectra from semiconductors Bi₂Te₃ and Sb₂Te₃

Published:1985-11 Issue:11 Volume:20 Page:1475-1479
ISSN:0232-1300
Container-title:Crystal Research and Technology
language:en
Short-container-title:Cryst. Res. Technol.

Author:

Chassé T.,Berg U.

Abstract

AbstractAngular resolved X‐ray photoelectron spectra (ARXPS) are measured for valence bands of the layer semiconductors Bi2Te3 and Sb2Te3. Starting from simple models taking into consideration the atomic construction, photoionization cross sections and the crystal structure the spectra can be interpreted. Important conclusions are drawn on the electronic structure of these semiconducting compounds.

Publisher

Wiley

Link

https://onlinelibrary.wiley.com/doi/pdf/10.1002/crat.2170201109

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2. The time-dependent process of oxidation of the surface of Bi₂Te₃studied by x-ray photoelectron spectroscopy;Journal of Physics: Condensed Matter;2000-06-13

3. XPS and EELS study of the bismuth selenide;Journal of Electron Spectroscopy and Related Phenomena;1999-07

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